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Please use this identifier to cite or link to this item: http://hdl.handle.net/2067/33211
DC FieldValueLanguage
dc.contributor.authorCamerlingo, C.en
dc.contributor.authorLisitskiy, M. P.en
dc.contributor.authorDe Stefano, L.en
dc.contributor.authorRea, I.en
dc.contributor.authorDelfino, Inesen
dc.contributor.authorLepore, M.en
dc.date.accessioned2020-10-20T22:50:49Z-
dc.date.available2020-10-20T22:50:49Z-
dc.date.issued2013en
dc.identifier.urihttp://hdl.handle.net/2067/33211-
dc.titleEvaluation of thin metal film thickness from light attenuation and multi-reflection effects on micro-Raman responseen
dc.typearticleen
dc.identifier.doi10.1016/j.tsf.2013.04.007en
dc.identifier.scopus2-s2-84877714589en
dc.identifier.isi318974800020en
dc.relation.issn406090en
dc.relation.journalTHIN SOLID FILMSen
dc.relation.firstpage142en
dc.relation.lastpage146en
dc.relation.numberofpages5en
dc.relation.conferencenameTHIN SOLID FILMSen
dc.relation.volume536en
dc.relation.issue536en
dc.type.miur262en
item.fulltextNo Fulltext-
item.openairetypearticle-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.journal.journalissn0040-6090-
crisitem.journal.anceE167264-
Appears in Collections:A1. Articolo in rivista
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